Protection against the (invisible) elements
Single event upsets, or SEUs for short, can cause severe data integrity issues by interfering with in-transit data as well as data stored in an SSD’s DRAM and NAND flash.
SEUs can have a variety of causes, but mainly occur as a result of cosmic rays – elementary particles and atomic nuclei that penetrate anything that crosses their paths as they travel through space. Naturally occurring background radiation and radiation from other sources such as medical and engineering equipment are also potential causes of SEUs.
We developed our exclusive Neutron Shield™ technology to tackle this normally inescapable threat to data integrity, providing unmatched protection against SEU-induced data integrity issues.
In mission-critical applications, Neutron Shield™ is an ideal complement to other Exascend data integrity-securing technologies such as RAID ECC and Data Path Protection – providing an additional layer of protection against data integrity issues.